
Test Charts
Resolution Charts, Siemens Stars, Pinholes and Checkerboards
The test structures are produced by ablation of the chromium layer, whereby structural sizes down to 100 nm are possible. At the same time, excellent dimensional tolerances and straightness of the structural edges are ensured. The test targets are embedded in a support of the standard size 75×25 mm² for microscope slides.
The structures are implemented as negative, i.e. the structures on the test are transparent, the background is blocked by a chrome layer.
For use with a microscope objective lens there is a version with a 0.17 mm cover glass available.
Resolution Chart TC-RT01
The simple arrangement of the structures and direct reading of the structure size on the test ensures intuitive handling.
In addition, there are 5 pinholes with diameters between 4.0 μm and 0.25 μm to allow a more detailed characterization of micro-imaging optics.
Price: 1125 Euro excl. VAT
Siemens Star TC-RT02
Thus, this test chart is also suitable for the determination of the resolution of microscope objectives of very high numerical aperture.
Additional measuring and positioning marks facilitate the adjustment. The pattern is “negative”, i.e. the Siemens stars are transparent.
Price: 1125 Euro excl. VAT
Checkerboard TC-CB50
The edges are extremely straight and sharp and therefore allow determination of local image quality as well.
Price: 950 Euro excl. VAT
Checkerboard TC-CB100
Price: 950 Euro excl. VAT
Star Test TC-ST01
The pinholes are provided with sufficient dark area to darken the entire field of view of the lens to be tested.
These pinholes are suitable for star testing of microscopic lenses and for general optical development tasks.
Price: 1125 Euro excl. VAT